Deep learning super-resolution electron microscopy based on deep residual attention network.
Jia WangChuwen LanCaiyong WangZehua GaoPublished in: Int. J. Imaging Syst. Technol. (2021)
Keyphrases
- deep learning
- super resolution
- electron microscopy
- low resolution
- high resolution
- unsupervised feature learning
- machine learning
- unsupervised learning
- low resolution images
- motion estimation
- single image
- deep architectures
- x ray
- weakly supervised
- high quality
- mental models
- super resolution reconstruction
- depth map
- maximum likelihood
- graph cuts
- viewpoint
- image processing