Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations.
Maryam AshoueiMuhammad Mudassar NisarAbhijit ChatterjeeAdit D. SinghAbdulkadir Utku DirilPublished in: VLSI Design (2007)
Keyphrases
- analog vlsi
- circuit design
- delay insensitive
- high speed
- vlsi circuits
- bayesian networks
- power dissipation
- objective function
- low cost
- generative model
- power consumption
- low power
- random access memory
- cmos technology
- floating gate
- autonomic computing systems
- data sets
- low voltage
- focal plane
- mixed signal
- adaptive systems
- infrared
- motion estimation
- neural network