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Strong Electro-Absorption in GeSi Epitaxy on Silicon-on-Insulator (SOI).

Ying LuoXuezhe ZhengGuoliang LiIvan ShubinHiren D. ThackerJin YaoJin-Hyoung LeeDazeng FengJoan FongCheng-Chih KungShirong LiaoRoshanak ShafiihaMehdi AsghariKannan RajAshok V. KrishnamoorthyJohn E. Cunningham
Published in: Micromachines (2012)
Keyphrases
  • silicon on insulator
  • ibm power processor
  • cmos technology
  • dynamic random access memory
  • general purpose
  • error resilience