Login / Signup
Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes.
Carlo De Santi
Matteo Meneghini
Gaudenzio Meneghesso
Enrico Zanoni
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
diffusion processes
diffusion process
room temperature
partial differential equations
laser beam
denoising