Login / Signup

Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes.

Carlo De SantiMatteo MeneghiniGaudenzio MeneghessoEnrico Zanoni
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • diffusion processes
  • diffusion process
  • room temperature
  • partial differential equations
  • laser beam
  • denoising