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Statistical Data Stability and Leakage Evaluation of FinFET SRAM Cells with Dynamic Threshold Voltage Tuning under Process Parameter Fluctuations.

Zhiyu LiuSherif A. TawfikVolkan Kursun
Published in: ISQED (2008)
Keyphrases
  • statistical data
  • evaluation process
  • bayesian networks
  • power system
  • learning bayesian networks
  • data sets
  • data sources
  • power consumption
  • parameter tuning
  • web interface