Login / Signup

Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction.

Ling-Ling LiXin-Bao ZhangMing-Lang TsengYa-Tong Zhou
Published in: Appl. Soft Comput. (2019)
Keyphrases
  • gaussian process regression
  • parameter values
  • similarity measure
  • training set
  • worst case
  • super resolution
  • random variables
  • closed form
  • high density