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Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction.
Ling-Ling Li
Xin-Bao Zhang
Ming-Lang Tseng
Ya-Tong Zhou
Published in:
Appl. Soft Comput. (2019)
Keyphrases
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gaussian process regression
parameter values
similarity measure
training set
worst case
super resolution
random variables
closed form
high density