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A Comparison Between Testability Measures Applied to Complex Gates.
José Luís Güntzel
Gustavo Wilke
Márcio Bystronski
Ana Cristina Medina Pinto
Ricardo Reis
Published in:
LATW (2002)
Keyphrases
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wide range
real world
data sets
image processing
data mining
information retrieval
three dimensional
database systems
artificial neural networks
multiresolution
computationally intensive
quantitative measures