Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification.
Minghao PiaoYi ShengJinda YanCheng Hao JinPublished in: ACM Trans. Knowl. Discov. Data (2024)
Keyphrases
- image classification
- image retrieval
- image features
- single image
- input image
- image description
- image data
- image content
- information retrieval
- low level
- probabilistic model
- feature vectors
- multiscale
- feature extraction
- image segmentation
- image analysis
- object retrieval
- image collections
- bayesian framework
- similarity matching
- relevance feedback
- extracted features
- text classification
- image representation
- feature selection
- maximum a posterior
- retrieval framework
- edge detection
- classification accuracy
- decision trees
- segmentation method
- pattern matching
- information retrieval systems
- markov random field
- retrieval process
- image database
- support vector machine
- preprocessing stage