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Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology.

Tommaso CilentoM. SchenkelC. YunR. MishraJunjun LiKiran V. ChattyRobert Gauthier
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • cmos technology
  • low power
  • low voltage
  • power consumption
  • embedded systems
  • pattern recognition
  • computer vision
  • digital images