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Improved Static Testing of A/D Converters for DC Measurements.

Attilio Di NisioNicola GiaquintoLaura FabbianoGiuseppe CavoneMario Savino
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • dynamic analysis
  • test cases
  • improved algorithm
  • database
  • learning algorithm
  • test set