An analytical mismatch model of nano-CMOS device under impact of intrinsic device variability.

Feng Hong Binjie Cheng Scott Roy David R. S. Cumming

Published in: ISCAS (2011)

Keyphrases

computational model
theoretical framework
prior knowledge
high level
low cost
experimental data
formal model
face recognition
em algorithm
statistical model
steady state
conceptual model
neural network model
prediction model
measurement data