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Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology.
Hao Cai
You Wang
Lirida A. B. Naviner
W. S. Zhao
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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cmos technology
wide range
low voltage
low power
image processing
magnetic field
parallel processing
power consumption
input output
computer systems
high speed
signal processing
pattern recognition
case study
multiple input
computer vision
flip flops
nm technology
silicon on insulator