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Aspect ratio of radiation-hardened MOS transistors - Modelling of the equivalent channel dimensions of integrated MOS transistors in radiation-hardened enclosed layout.

Varvara BezhenovaAlicja Malgorzata Michalowska-Forsyth
Published in: Elektrotech. Informationstechnik (2018)
Keyphrases
  • aspect ratio
  • high resolution
  • perspective projection
  • three dimensional
  • ground truth
  • vision system