Login / Signup
Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM.
Stephen Lynd Christensen
Brian M. Haines
Uday D. Lanke
Matthew F. Paige
Stephen G. Urquhart
Published in:
IBM J. Res. Dev. (2011)
Keyphrases
</>
electron microscopy
low energy
electron microscope
x ray
three dimensional
noise level
energy consumption
thin film
neural network
image reconstruction
energy efficient