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An Optimal Policy for Target Localization with Application to Electron Microscopy.
Raphael Sznitman
Aurélien Lucchi
Peter I. Frazier
Bruno Jedynak
Pascal Fua
Published in:
ICML (1) (2013)
Keyphrases
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optimal policy
electron microscopy
markov decision processes
reinforcement learning
state space
dynamic programming
multistage
long run
x ray
infinite horizon
finite horizon
state dependent
low energy
neural network
decision problems
control policies
serial inventory systems
production system
sufficient conditions