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Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy.
Takeshi Uruma
Nobuo Satoh
Hidekazu Yamamoto
Futoshi Iwata
Published in:
MHS (2018)
Keyphrases
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image analysis
high speed
three dimensional
low cost
transmission line
data acquisition
silicon dioxide