Fast AFM Imaging Based on Neural Network Compressed Sensing.
Meng SunNa ChenShaoying LiZhenmin LiuShuai YeYana ShangShupeng LiuFufei PangTingyun WangPublished in: MMSP (2022)
Keyphrases
- compressed sensing
- atomic force microscopy
- neural network
- image reconstruction
- random projections
- natural images
- sparse representation
- compressive sampling
- signal processing
- pattern recognition
- computer vision
- image processing
- high resolution
- fourier domain
- higher order
- image analysis
- linear discriminant analysis
- original data
- multiscale
- orthogonal matching pursuit