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Design impact of positive temperature dependence of drain current in sub 1 V CMOS VLSIs.
Kouichi Kanda
Kouichi Nose
Hiroshi Kawaguchi
Takayasu Sakurai
Published in:
CICC (1999)
Keyphrases
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real time
design process
case study
positive and negative
design principles
database
information systems
current status
circuit design
single chip