Mating Sensitivity Analysis and Statistical Verification for Efficient Yield Estimation.
Ibtissem SeghaierMohamed H. ZakiSofiène TaharPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
- sensitivity analysis
- managerial insights
- statistically sound
- influence diagrams
- statistical information
- gaussian markov random fields
- data driven
- variational inequalities
- estimation accuracy
- accurate estimation
- face verification
- density estimation
- convex optimization
- computationally expensive
- cost effective
- computationally efficient
- statistical analysis