Investigation into the properties of the explicit method for the resolution of the semiconductor device equations.
Jacco L. PleumeekersClaude M. SimonSerge MottetPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
- experimental evaluation
- pairwise
- high precision
- preprocessing
- detection method
- high accuracy
- synthetic data
- significant improvement
- dynamic programming
- optimization method
- image processing
- segmentation method
- computationally efficient
- optimization algorithm
- edge detection
- probabilistic model
- mathematical model
- cost function
- similarity measure