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Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities.
Francesco Corsi
Cristoforo Marzocca
S. Martino
Published in:
ED&TC (1996)
Keyphrases
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probability distribution
circuit design
high quality
low cost
high speed
levels of abstraction
higher quality
spatial distribution
data distribution
class membership
quality assessment
probability density function
power consumption
fault diagnosis
random variables
higher level
digital libraries