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Methodology for Diagnosis of Defect or Damage in Reflection-Symmetric Multilayer Structures Using Analysis of Late-Time Natural-Mode Amplitudes.

Ugur Cem HasarHamdullah OzturkVahid NayyeriOmar M. Ramahi
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • machine learning
  • data analysis
  • database
  • real time
  • real world
  • decision making
  • multiscale
  • image analysis
  • fault diagnosis
  • quantitative analysis