Design of Fast-axis Collimated Image Inspection System for Semiconductor Lasers.
Peidong XuYang QianPengyu LiBin WangYong WangXiantao WangPublished in: ICCCS (2021)
Keyphrases
- image data
- image features
- input image
- image analysis
- image content
- multiscale
- image retrieval
- template matching
- image classification
- single image
- image segmentation
- keypoints
- image pixels
- image structure
- image collections
- test images
- image regions
- edge detection
- low level
- image representation
- segmentation algorithm
- segmentation method
- vision system
- hough transform
- spatial information
- image matching
- high resolution
- pattern spectrum
- pixel values
- printed circuit boards
- computer vision
- vector field
- visual features
- image sequences
- case study