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Anomalous Exponents and Dipole Solutions for the Thin Film Equation.

Josephus HulshofJohn R. KingMark Bowen
Published in: SIAM J. Appl. Math. (2001)
Keyphrases
  • thin film
  • anomaly detection
  • boundary value problem
  • short circuit
  • grain size
  • solar cell
  • white light interferometry
  • optimal solution
  • fuzzy logic
  • data management
  • mathematical model
  • room temperature