ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors.
Joop P. M. Van LammerenPublished in: J. Electron. Test. (1999)
Keyphrases
- computational cost
- high precision
- experimental evaluation
- detection method
- high accuracy
- cost function
- optimization algorithm
- significant improvement
- pairwise
- preprocessing
- statistical significance
- test data
- fully automatic
- classification method
- sensor data
- optimization method
- image segmentation
- clustering method
- signal processing
- markov random field
- support vector machine
- objective function
- multiscale
- bayesian networks
- similarity measure