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Time-resolved optical characterization of electrical activity in integrated circuits.

James C. TsangJeffrey A. KashDavid P. Vallett
Published in: Proc. IEEE (2000)
Keyphrases
  • integrated circuit
  • electrical activity
  • electron beam
  • printed circuit boards
  • ecg signals
  • eeg signals
  • optical imaging
  • face recognition
  • high resolution
  • manufacturing systems
  • font recognition