Embedding test patterns into Low-Power BIST sequences.

Ioannis Voyiatzis

Published in: IOLTS (2007)

Keyphrases

low power
power consumption
low cost
high speed
sequential patterns
single chip
high power
built in self test
wireless transmission
logic circuits
vlsi circuits
low power consumption
digital signal processing
hidden markov models
vlsi architecture
image sensor
frequent patterns
image processing
gate array