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IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.

Paul MarkoMatteo MeneghiniSergey BychikhinDenis MarconGaudenzio MeneghessoEnrico ZanoniDionyz Pogany
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • random noise
  • image analysis
  • low snr
  • denoising
  • low cost