A comparative study of algorithms for generating switch cover test sets.
Matheus Monteiro MarianoÉrica Ferreira de SouzaAndré Takeshi EndoNandamudi L. VijaykumarPublished in: SBQS (2016)
Keyphrases
- test set
- error rate
- learning algorithm
- significant improvement
- orders of magnitude
- theoretical analysis
- genetic algorithm
- data structure
- training set
- worst case
- data sets
- high speed
- times faster
- test cases
- benchmark datasets
- constraint satisfaction problems
- computationally efficient
- optimization problems
- computational complexity
- data streams
- data mining