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Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis.
L. R. Van den Doel
Lucas J. van Vliet
K. T. Hjelt
Michael J. Vellekoop
Ian T. Young
F. Gromball
Jan G. Korvink
Published in:
ICPR (2000)
Keyphrases
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databases
computer vision
artificial neural networks
image analysis
artificial intelligence
image segmentation