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Horizontal-FPN fault coverage improvement in production test of CMOS imagers.
Richun Fei
Jocelyn Moreau
Salvador Mir
Alexis Marcellin
C. Mandier
E. Huss
G. Palmigiani
P. Vitrou
Thomas Droniou
Published in:
VTS (2015)
Keyphrases
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significant improvement
production system
production planning
real time
neural network
real world
e learning
feature selection
evolutionary algorithm
hidden markov models
software engineering
manufacturing processes