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PCB Soldering Defect Inspection Using Multitask Learning under Low Data Regimes.

Sik-Ho TsangZhaoqing SuoTom Tak-Lam ChanHuu-Thanh NguyenDaniel Pak-Kong Lun
Published in: Adv. Intell. Syst. (2023)
Keyphrases
  • data sets
  • knowledge discovery
  • defect detection
  • multitask learning
  • feature extraction
  • probabilistic model