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STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations.

Elena I. VatajeluRosa Rodríguez-MontañésMarco IndacoPaolo PrinettoJoan Figueras
Published in: DTIS (2015)
Keyphrases
  • real time
  • neural network
  • database
  • information systems
  • case study
  • artificial neural networks
  • process model
  • development process
  • evaluation metrics