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Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology.
Claudio Accarino
Mohammed Al-Rawhani
Yash Diptesh Shah
Dzmitry Maneuski
Srinjoy Mitra
Craig Buttar
David R. S. Cumming
Published in:
ISCAS (2018)
Keyphrases
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cmos technology
high noise
low power
power consumption
spl times
low signal to noise ratio
parallel processing
silicon on insulator
low voltage
power dissipation
high speed
image sensor
pattern recognition
signal to noise ratio
hidden markov models
mixed signal
high resolution