On Embedding Test Patterns into Low-Power Bist Sequences.
Ioannis VoyiatzisPublished in: J. Comput. Inf. Syst. (2008)
Keyphrases
- low power
- low cost
- power consumption
- high speed
- built in self test
- sequential patterns
- high power
- vlsi circuits
- mixed signal
- logic circuits
- wireless transmission
- low power consumption
- digital signal processing
- hidden markov models
- single chip
- cmos technology
- vlsi architecture
- power dissipation
- hardware and software
- real time
- image sensor
- frequent patterns
- gate array