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Efficient Grouping of Fail Chips for Volume Yield Diagnostics.
Lavanya Jagan
Ratan Deep Singh
V. Kamakoti
Ananta K. Majhi
Published in:
VLSI Design (2009)
Keyphrases
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data mining
social networks
knowledge base
case study
neural network
real world
clustering algorithm
similarity measure
expert systems
high speed
cost effective
integrated circuit
perceptual grouping