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Efficient Grouping of Fail Chips for Volume Yield Diagnostics.

Lavanya JaganRatan Deep SinghV. KamakotiAnanta K. Majhi
Published in: VLSI Design (2009)
Keyphrases
  • data mining
  • social networks
  • knowledge base
  • case study
  • neural network
  • real world
  • clustering algorithm
  • similarity measure
  • expert systems
  • high speed
  • cost effective
  • integrated circuit
  • perceptual grouping