Efficient Grouping of Fail Chips for Volume Yield Diagnostics.

Lavanya Jagan Ratan Deep Singh V. Kamakoti Ananta K. Majhi

Published in: VLSI Design (2009)

Keyphrases

data mining
social networks
knowledge base
case study
neural network
real world
clustering algorithm
similarity measure
expert systems
high speed
cost effective
integrated circuit
perceptual grouping