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Compact and Highly Testable Error Indicator for Self-Checking Circuits.

Cecilia MetraMichele FavalliBruno Riccò
Published in: DFT (1996)
Keyphrases
  • error rate
  • high speed
  • relative error
  • circuit design
  • logic synthesis
  • database
  • artificial intelligence
  • search engine
  • decision trees
  • lower bound
  • error analysis
  • measurement error