A modified method of logical effort for FinFET circuits considering impact of fin-extension effects.
Archana PandeyPitul GargShobhit TyagiRajeev RanjanAnand BulusuPublished in: ISQED (2018)
Keyphrases
- similarity measure
- detection method
- high precision
- significant improvement
- main contribution
- experimental evaluation
- computational cost
- high accuracy
- support vector machine
- neural network
- evaluation method
- fully automatic
- mathematical model
- synthetic data
- preprocessing
- semi supervised
- probabilistic model
- input data
- dynamic programming
- cost function
- prior knowledge
- segmentation method
- objective function
- bayesian networks
- data sets