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Realizing a high measure of confidence for defect level analysis of random testing [VLSI].

Wen-Ben JoneParesh GondaliaAllan Gutjahr
Published in: IEEE Trans. Very Large Scale Integr. Syst. (1995)
Keyphrases
  • signal processing
  • databases
  • multiscale
  • wide range
  • data analysis
  • correlation coefficient
  • real world
  • knowledge base
  • image sequences
  • multi agent
  • hidden markov models
  • distance measure
  • information theory
  • vlsi design