A Novel Contact Resistance Model of Anisotropic Conductive Film for FPD Packaging

Gou-Jen Wang Yi-Chin Lin Gwo-Sen Lin

Published in: CoRR (2007)

Keyphrases

computational model
formal model
probabilistic model
object model
neural network
management system
genetic algorithm
multiscale
probability distribution
bayesian networks
edge detection
input data
similarity measure
theoretical framework
statistical model
conceptual model
case study