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Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout.
Jose María Ruíz
Raúl Fernández-García
Ignacio Gil
Marta Morata
Published in:
J. Electron. Test. (2012)
Keyphrases
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digital circuits
power consumption
circuit design
low cost
model based diagnosis
low power
data flow
high speed
low voltage
multi agent
relational databases
constraint satisfaction
finite state machines
total energy
mixed signal