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A fully parallel BIST-based method to test the crosstalk defects on the inter-switch links in NOC.
Reza Nourmandi-Pour
Nafiseh Mousavian
Published in:
Microelectron. J. (2013)
Keyphrases
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test data
clustering method
experimental evaluation
detection method
high precision
similarity measure
probabilistic model
synthetic data
classification method
feature selection
objective function
prior knowledge
classification accuracy
high accuracy