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Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam.

Nicolas W. HengartnerSarah Ellen MichalakBruce E. TakalaStephen A. Wender
Published in: Technometrics (2008)
Keyphrases
  • cross section
  • cross sections
  • cross sectional
  • rigid body
  • magnetic field
  • failure rate
  • color images
  • shape recovery