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Implementation of a Fluctuation Smoothing Production Control Policy in IBM's 200mm Wafer Fab.

James R. MorrisonBrian CampbellElizabeth DewsJohn LaFreniere
Published in: CDC/ECC (2005)
Keyphrases
  • control policy
  • semiconductor manufacturing
  • long run
  • control policies
  • real time
  • machine learning
  • bayesian networks
  • quality control
  • integrated circuit
  • admission control
  • approximate dynamic programming