A method for testability analysis and BIST insertion at the RTL.
Joan CarlettaChristos A. PapachristouPublished in: ED&TC (1995)
Keyphrases
- high precision
- main contribution
- dynamic programming
- preprocessing
- pairwise
- detection method
- clustering method
- objective function
- high accuracy
- probabilistic model
- evaluation method
- classification method
- optimization algorithm
- theoretical analysis
- input image
- neural network
- experimental evaluation
- cost function
- image analysis
- similarity measure
- classification accuracy
- computational cost
- mutual information
- support vector machine svm
- significant improvement
- multiresolution
- training data
- genetic algorithm