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Non-Linear CNN-Based Read Channel for Hard Disk Drive With 30% Error Rate Reduction and Sequential 200-Mbits/s Throughput in 28-nm CMOS.
Yuwei Qin
Ruben Purdy
Alec Probst
Ching-Yi Lin
Jian-Gang Jimmy Zhu
Published in:
IEEE J. Solid State Circuits (2023)
Keyphrases
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error rate
hard disk drive
solid state
test set
cmos technology
power consumption
silicon on insulator
nm technology
high speed
word error rate
metal oxide semiconductor
low cost
low power
equal error rate
misclassification rate
failure rate
lower error rates
false discovery rate
image processing