Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis.
Hong-Dar LinChung-Yu ChungWan-Ting LinPublished in: IPCV (2010)
Keyphrases
- factor analysis
- statistical tests
- independent component analysis
- component analysis
- cluster analysis
- discriminant analysis
- multiple regression
- matrix factorization
- automatic model selection
- regression model
- information criterion
- classification and regression trees
- data mining
- principal component analysis
- pairwise
- latent factors
- correspondence analysis