ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell.
Hiromitsu AwanoMasayuki HiromotoTakashi SatoPublished in: DATE (2015)
Keyphrases
- preprocessing
- cost function
- experimental evaluation
- computational complexity
- high precision
- synthetic data
- error rate
- fully automatic
- em algorithm
- theoretical analysis
- computationally efficient
- cross entropy
- detection method
- clustering method
- detection algorithm
- decision trees
- feature set
- significant improvement
- similarity measure
- image segmentation