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Ensure an original and safe "fail-to-open" mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation.

F. BoigeFrédéric RichardeauStéphane LefebvreJean-Marc BlaquièreG. GuibaudA. Bourennane
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • short circuit
  • mobile devices
  • mobile applications
  • power consumption
  • thin film
  • induction motor
  • electric vehicles
  • real time
  • computer vision
  • image processing
  • power dissipation