Two New Metrics for Feature Selection in Pattern Recognition.
Pedro Y. PiñeroLeticia ArcoMaría M. GarcíaYaile CaballeroRaykenler YzquierdoAlfredo MoralesPublished in: CIARP (2003)
Keyphrases
- pattern recognition
- feature selection
- feature extraction
- machine learning
- dimensionality reduction
- high dimensionality
- signal processing
- text categorization
- image processing
- text classification
- neural network
- chi squared
- selected features
- feature space
- computer vision
- information gain
- feature subset
- support vector machine
- pattern recognition problems
- classification accuracy
- image analysis
- software defect prediction
- feature weighting
- forward selection
- unsupervised learning
- data mining and pattern recognition
- support vector
- knn
- feature set
- pattern classification
- gene expression data
- model selection
- rough sets
- feature selection algorithms
- mutual information
- discriminative features
- similarity metrics
- data mining
- irrelevant features
- quality metrics
- fuzzy sets
- pattern analysis
- ensemble learning
- evaluation metrics
- speech recognition